prikaz prve stranice dokumenta In situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers
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master's thesis
In situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers
2020. urn:nbn:hr:182:759151
Šantić, Natalija
Josip Juraj Strossmayer University of Osijek
Department of Chemistry

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Šantić, N. (2020). In situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers (Master's thesis). Retrieved from https://urn.nsk.hr/urn:nbn:hr:182:759151

Šantić, Natalija. "In situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers." Master's thesis, Josip Juraj Strossmayer University of Osijek, Department of Chemistry, 2020. https://urn.nsk.hr/urn:nbn:hr:182:759151

Šantić, Natalija. "In situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers." Master's thesis, Josip Juraj Strossmayer University of Osijek, Department of Chemistry, 2020. https://urn.nsk.hr/urn:nbn:hr:182:759151

Šantić, N. (2020). 'In situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers', Master's thesis, Josip Juraj Strossmayer University of Osijek, Department of Chemistry, accessed 15 March 2023, https://urn.nsk.hr/urn:nbn:hr:182:759151

Šantić N. In situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers [Master's thesis]. Osijek: Josip Juraj Strossmayer University of Osijek, Department of Chemistry; 2020 [cited 2023 March 15] Available at: https://urn.nsk.hr/urn:nbn:hr:182:759151

N. Šantić, "In situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers", Master's thesis, Josip Juraj Strossmayer University of Osijek, Department of Chemistry, Osijek, 2020. Available at: https://urn.nsk.hr/urn:nbn:hr:182:759151

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Metadata
TitleIn situ transmission electron microscopy investigation of the decomposition of the epitaxial GeSn layers
Title (croatian)In situ istraživanje termičkog raspada epitaksijalnih slojeva GeSn legure transmisijskom elektronskom mikroskopijom
AuthorNatalija Šantić
MentorTomislav Balić (mentor)
MentorHeiko Groiss https://orcid.org/0000-0002-2238-4805 (komentor)
Committee memberMartina Medvidović-Kosanović (predsjednik povjerenstva)
Committee memberAleksandar Sečenji (član povjerenstva)
Committee memberTomislav Balić (član povjerenstva)
GranterJosip Juraj Strossmayer University of Osijek
Department of Chemistry
Osijek
Defense date and country2020-11-24, Croatia
Scientific / art field,
discipline and subdiscipline		NATURAL SCIENCES
Chemistry
Inorganic Chemistry
Abstract
Legura \( Ge_{1-x}Sn_{x}\) s x> 0,01 termodinamički je metastabilna i Sn na temperaturama iznad ≈230°C teži odvajanju, difundiranju i taloženju kao β-Sn u strukturama nalik kapljicama. In situ eksperimenti žarenja u transmisijskom elektronskom mikroskopu omogućuju promatranje i proučavanje termičkog raspada epitaksijalnih slojeva \( Ge_{1-x}Sn_{x}\). Jedan od glavnih zahtjeva za ispitivanja putem TEM-a je uzorak proziran za elektrone. Prema tome priprema uzorka je ključni korak prema TEM pokusima. Postupak pripreme uzorka razvijen je kombinacijom različitih tehnika pripreme. Prvo, MBE sintetizirani \( Ge_{1-x}Sn_{x}\) i referentni materijal Si (s Ge kvantnim točkama) pripremljeni su tehnikom klinastog poliranja. Nadalje, fokusirani ionski snop (FIB) korištena je za pripremu grijaćeg čipa za in situ eksperiment žarenja. Različite metode mikroskopije korištene su za optimizaciju i validaciju razvijenog postupka pripreme uzorka za in situ TEM eksperiment žarenja
Abstract (english)
The \( Ge_{1-x}Sn_{x}\) alloy with x>0.01 is thermodynamically metastable and Sn tends to diffuse, segregate or precipitate as β-Sn in a droplet-like structure at temperature above ≈230°C. In situ heating experiments via transmission electron microscopy (TEM) allows us to observe and study the decomposition process of \( Ge_{1-x}Sn_{x}\). The main requirement for TEM investigation is an electron transparent specimen. Hence, specimen preparation is a key step towards TEM experiments. The sample preparation procedure has been developed using a combination of preparation techniques. The MBE synthesized \( Ge_{1-x}Sn_{x}\) and reference material Si (with Ge quantum dots) have been prepared with wedge polishing technique. Further, focused ion beam (FIB) has been used to prepare a heating chip for the in situ TEM heating experiment. Various microscopy methods have been used to optimize and validate the developed sample preparation procedure.
Keywords
Keywords (english)
Languagecroatian
URN:NBNurn:nbn:hr:182:759151
Study programmeTitle: Graduate University Study of Chemistry; research program; specializations in: Research program
Course: Research program
Study programme type: university
Study level: graduate
Academic / professional title: magistar/magistra kemije (magistar/magistra kemije)
Type of resourceText
File originBorn digital
Access conditionsOpen access
Terms of useLicence In copyright icon
Public noteRad je izrađen na: Johannes Kepler University Linz, Centre of Surface and Nanoanalytics i Christian Doppler Laboratory for Nanoscale phase Transformations.
Created on2020-12-11 11:59:14